In a semiconductor IC fabrication, assume a 20 cm diameter wafer
has a cost of 15 units, contains 100 dies, and has 0.03
defects/cm2. If the number of dies per wafer is increased by 5% and
the defects per area increases by 10%:
A. Find the new die area and new yield
B. By what factor or percentage does the yield change
C. By what factor or percentage does the cost per die change
In a semiconductor IC fabrication, assume a 20 cm diameter wafer has a cost of 15 units, contains 100 dies, and has 0.03
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