- B I Ii List Three 3 Methods That Can Be Used To Test A Combinational Circuit In The Design For Test Dft Of Int 1 (36.82 KiB) Viewed 42 times
(b) (i) (ii) List THREE (3) methods that can be used to test a combinational circuit in the Design for Test (DFT) of int
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(b) (i) (ii) List THREE (3) methods that can be used to test a combinational circuit in the Design for Test (DFT) of int
(b) (i) (ii) List THREE (3) methods that can be used to test a combinational circuit in the Design for Test (DFT) of integrated circuit. (3 marks) Design a scan path test for a flip-flop using a multiplexer and explain how the test is conducted.