IV. (20 total pts) Consider the MOS capacitor shown below The substrate doping is Nx=1x106cm. The oxide thickness to = 1x104cm. The gate is a metal and the gate metal potential is ØM = 1V VGB=0 (the device is in equilibrium) VGB Gate SiO2 P-Si Doping: N - tox 0 X do х
c) (2pts) Write the electric field at x=0- (in the semiconductor) as a function of do. Na and ESI d) (2pts) Write the potential at x=0" (in the semiconductor)as a function of e, Xao. Na and Esi e) (2pts) Write the electric field at x=0- (in the oxide) as a function of Xao. Na and Eox f) (2pts) Write the potential Øyas a function of p, Xao. NA. Esi. Cos. Eoxandt 2 ox g) (2pts) Use this expression to find a numerical value of xao For these questions VG #0 h) (2pts) Calculate the flatband voltage. 1) (2pts) Write the applied voltage as a function of the flatland voltage op, Na. Esi, and Cox 1) (2pts) Calculate the threshold voltage VIH
IV. (20 total pts) Consider the MOS capacitor shown below The substrate doping is Nx=1x106cm. The oxide thickness to = 1
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IV. (20 total pts) Consider the MOS capacitor shown below The substrate doping is Nx=1x106cm. The oxide thickness to = 1
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