true.
- Explain Your Answer Behind Why The Statements Chosen Are True 1 (86.65 KiB) Viewed 20 times
Explain your answer behind why the statements chosen are true.
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Explain your answer behind why the statements chosen are true.
Explain your answer behind why the statements chosen are
true.
Q.6 Testing is critical to the integrated circuit value chain because it enables the design or the chip functionality to be assessed at post manufacturing. (a) Which of the following statement(s) is (are) true? (Note: There might be more than one choice) [2 marks I. II. = III. There are only two classes of testing methods: functional and structural. Both functional and structural test methods validate the correct operations and specifications of the device under test. Functional test is the most optimum test condition in terms of test cost, test quality and test time since it only needs to validate a specific functionality of the device under test. Knowledge of internal structures is not required. The choice of structural testing over functional testing is just for the purpose of debugging through better controllability and observability. Every circuit can be tested with good coverage using functional testing. Scan test is also commonly called structural test in IC testing. IV. V.
true.
Q.6 Testing is critical to the integrated circuit value chain because it enables the design or the chip functionality to be assessed at post manufacturing. (a) Which of the following statement(s) is (are) true? (Note: There might be more than one choice) [2 marks I. II. = III. There are only two classes of testing methods: functional and structural. Both functional and structural test methods validate the correct operations and specifications of the device under test. Functional test is the most optimum test condition in terms of test cost, test quality and test time since it only needs to validate a specific functionality of the device under test. Knowledge of internal structures is not required. The choice of structural testing over functional testing is just for the purpose of debugging through better controllability and observability. Every circuit can be tested with good coverage using functional testing. Scan test is also commonly called structural test in IC testing. IV. V.
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