A silicon bar 1 um and 100 um? in cross-sectional area is doped such that the Fermi level is 200 meV below the conductio
Posted: Fri May 20, 2022 10:32 pm
A silicon bar 1 um and 100 um? in cross-sectional area is doped such that the Fermi level is 200 meV below the conduction band edge at equilibrium and has a majority carrier diffusion coefficient of 20.6 cm-/s. An 8 mV bias is applied to the silicon bar at 300 K. а (a) Calculate the Hall coefficient and sign associated with the majority carriers. (12 pts)