Answer Happy

Fault Isolation is pivotal to the success of product defect learning. It pinpoints the locations of potential defects before physical failure analysis to reveal the root cause. In general, fault isolation approaches can be classified as software and hardware based techniques. (a) Name 2 software based methods [2 marks] (b) Image in Fig. Q7a shows a typical scanning electron microscope (SEM) image at the CA level. Image in Fig. 27b shows the corresponding layout. Indicate with bounding box on the layout, the boundary of an SRAM cell. State the defect found and what failure signature is manifested in bitmapping. [3 marks] CA/PC TH 05 Fig. 7a Fig. 276