6. A scanning tunnelling microscope (STM) is used to scan a conducting surface which is biased by -0.75 V with respect t
Posted: Mon May 02, 2022 4:43 pm
6. A scanning tunnelling microscope (STM) is used to scan a conducting surface which is biased by -0.75 V with respect to the tip of the STM. Estimate the distance the tip has to be moved away from the surface to lower the tunnelling current by 25%. The work function of the tip is 4.1 eV.