1. (Txt Bk 6.67) The nine measurements that follow are furnace temperatures recorded on successive batches in a semicond

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1. (Txt Bk 6.67) The nine measurements that follow are furnace temperatures recorded on successive batches in a semicond

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1 Txt Bk 6 67 The Nine Measurements That Follow Are Furnace Temperatures Recorded On Successive Batches In A Semicond 1
1 Txt Bk 6 67 The Nine Measurements That Follow Are Furnace Temperatures Recorded On Successive Batches In A Semicond 1 (29.19 KiB) Viewed 99 times
1. (Txt Bk 6.67) The nine measurements that follow are furnace temperatures recorded on successive batches in a semiconductor manufacturing process (units are °F): 953, 950, 948, 955, 951, 949, 957, 954, 955. (a) Calculate the sample mean, median, mode, variance, and standard deviation. (10 pts) (b) Construct a frequency table with class frequency, relative frequency and cumulative frequency with the given class interval. 947.5 - 951.5 951.5 - 955.5 955.5 - 959.5 Draw a histogram of the class frequency. (5 pts) (c) Construct a box plot of the data. (5 pts)
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